Vista normal Vista MARC Vista ISBD

Characterization and metrology for ULSI technology : 2003 International Conference on Characterization and Metrology for ULSI Technology, Austin, Texas, 24-28 March 2003 / editors, David G. Seiler ... [y otros.] - 819 páginas : ilustraciones + 1 disco optico laser para computadora - AIP conference proceedings 683 . - AIP conference proceedings .

ISBN: 0735401527

Subjects--Topical Terms:
Circuitos integrados--Ultra integración a gran escala--Congresos
Circuitos integrados--Ultra integración a gran escala--Software--Congresos

LC Class. No.: TK7874.76 / C43 2003