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Pichler, Peter,

Intrinsic point defects, impurities, and their diffusion in silicon / Peter Pichler - xxi, 554 páginas : ilustraciones - Computational microelectronics . - Computational microelectronics .

ISBN: 3211206876 (empastado)

Subjects--Topical Terms:
Cristales de silicio--Defectos
Semiconductores--Difusión

LC Class. No.: TK7871.15S55 / P53