Vista normal Vista MARC Vista ISBD

Materials reliability in microelectronics III/ ed. Kenneth P. Rodbell ... [y otros.] - 497 páginas - Materials research society symposium proceedings 309 .

"Symposium held April 12-15 1993, San Francisco, California, U.S.A."

ISBN: 1558992057

Subjects--Topical Terms:
Microelectronica--Confiabilidad--Congresos
Microelectrónica--Materiales--Pruebas--Congresos
Electrodifusion--Congresos

LC Class. No.: TK7874. / M369 1993