Electrically based microstructural characterization III :  symposium held November 26-29 at the 2001 MRS Fall Meetin in Boston, Massachusetts, U.S.A. / 
 Electrically based microstructural characterization two  Electrically based microstructural characterization 3 
editors, Rosario A. Gerhardt ... [y otros.] 
 - xi, 367 páginas :  ilustraciones ; 
 - Materials Research Society symposium proceedings  699 .
 - Materials Research Society symposium proceedings .
<br/><br/><label>ISBN: </label>1558996354 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Materiales--Microscopia--Congresos<br/>Microestructura--Congresos
<br/><br/><label>LC Class. No.: </label>TA417.23  / E54 2002