Pichler, Peter, <br/><br/>
Intrinsic point defects, impurities, and their diffusion in silicon / 
Peter Pichler 
 - xxi, 554 páginas :  ilustraciones 
 - Computational microelectronics .
 - Computational microelectronics .
<br/><br/><label>ISBN: </label>3211206876 (empastado) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Cristales de silicio--Defectos<br/>Semiconductores--Difusión
<br/><br/><label>LC Class. No.: </label>TK7871.15S55  / P53