TY  - BOOK
AU  - Canales-Pozos, S. A.
AU  - Rios-Jara, D.
AU  - Alvarez-Fregoso, O.
AU  - Alvarez-Perez, M. A.
AU  - Garcia, M.
AU  - Martinez Sanchez, E.
AU  - Juarez-Islas, J. A.
AU  - Zelaya-Angel, O.
AU  - Mendoza-Alvarez, J. G.
ED  - Centro de Investigacion en Materiales Avanzados (CIMAV)
ED  - Universidad Nacional Autonoma de Mexico. Instituto de Investigaciones en Materiales
ED  - Instituto Politecnico Nacional. Centro de Investigacion y de Estudios Avanzados
TI  - Morphological, optical, and photoluminescent characteristics of GaAs/sub 1-x/N/sub x/ nanowhiskered thin films
PB  - 2001.
KW  - Atomic force microscopy
KW  - Gallium arsenide
KW  - Gallium compounds
KW  - Grain size
KW  - III-V semiconductors
KW  - Nanostructured materials
KW  - Photoluminescence
KW  - Spectral line shift
KW  - Sputtered coatings
KW  - Visible spectra
KW  - Whiskers (crystal)
KW  - Photoluminescent characteristics
KW  - Optical characteristics
KW  - Morphological characteristics
KW  - GaAs/sub 1-x/N/sub x/ nanowhiskered thin films
KW  - Solid-solution
KW  - Glass substrates
KW  - Radio-frequency sputtering technique
KW  - Atomic-force microscopy images
KW  - Whisker shape
KW  - Substrate temperature
KW  - Surface morphology
KW  - Whisker-like features
KW  - Nanowhisker diameter
KW  - Optical absorption spectra
KW  - Band-gap energy blueshift
KW  - Strong quantum-confinement effects
KW  - Blue range
KW  - Quantum-size effects
KW  - GaAsN
UR  - https://iim-b.bibliotecas.unam.mx:81/opac-tmpl/bootstrap/images/documentos/articulos/2001-58.pdf
ER  -