Materials reliability in microelectronics III/ 
ed. Kenneth P. Rodbell ... [y otros.] 
 - 497 páginas 
 - Materials research society symposium proceedings  309 .
<br/><br/> "Symposium held April 12-15 1993, San Francisco, California, U.S.A." 
<br/><br/><label>ISBN: </label>1558992057 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Microelectronica--Confiabilidad--Congresos<br/>Microelectrónica--Materiales--Pruebas--Congresos<br/>Electrodifusion--Congresos
<br/><br/><label>LC Class. No.: </label>TK7874.  / M369 1993