TY  - BOOK
AU  - Roedbell, Kenneth P.
ED  - Materials Research Society
TI  - Materials reliability in microelectronics III
T2  - Materials research society symposium proceedings
SN  - 1558992057
AV  - TK7874. M369 1993
PY  - 1993///
CY  - Pittsburg, Pennsylvania
PB  - Materials Research Society
KW  - Microelectronica
KW  - Confiabilidad
KW  - Congresos
KW  - Microelectrónica
KW  - Materiales
KW  - Pruebas
KW  - Electrodifusion
N1  - "Symposium held April 12-15 1993, San Francisco, California, U.S.A."
ER  -