TY  - BOOK
AU  - Richards, B. P.,
AU  - Footner, P. K.,
ED  - University of Oxford
TI  - The role of microscopy in semiconductor failure analysis
T2  - Microscopy handbooks
SN  - 0198564325
AV  - TK7871.85 R48
PY  - 1992///
CY  - Oxford
PB  - Oxford University Press
KW  - Semiconductores
KW  - Pruebas
KW  - Fallas
KW  - Microscopios
ER  -