TY  - BOOK
AU  - Bai,Chunli
TI  - Scanning tunneling microscopy and its application
T2  - Springer series in surface sciences
SN  - 7532327876 (Shanghai : papel libre de acido)
AV  - QC173.4S94 B35 1995
U1  - 502/.8/25 20
PY  - 1995///
CY  - Shanghai, Berlin
PB  - Scientific & Technical, Springer Verlag
KW  - Microscopía túnel de barrido
KW  - Superficies (Física)
KW  - Química de superficies
N1  - Traduccion revisada de la edicion original en chino: Saomiao suidao xian weishu ji qi yingyong. 1992; Includes bibliographical references (p. 309-325) and index
ER  -