TY  - BOOK
AU  - Teate,A.A.
AU  - Halder,N.C.
TI  - Band tailings and deep defects in semiconductors
SN  - 3908450187
AV  - QC611.6 T43
PY  - 1996///
CY  - Switzerland
PB  - Scitec
KW  - Semiconductores
KW  - Defectos
ER  -