| 000 | 01118nam a2200337zi 4500 | ||
|---|---|---|---|
| 005 | 20230621110949.0 | ||
| 008 | 001019s1999 nyu b 001 0 eng | ||
| 020 | _a0198501897 | ||
| 035 | _aMX001000861696 | ||
| 040 |
_aDLC _cDLC |
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| 041 | _aENG | ||
| 050 | 0 |
_aQD945 _bS59 |
|
| 082 | 0 | 0 |
_a548/.83 _221 |
| 084 | _aSerie y General | ||
| 100 | 1 |
_aSnyder, Robert L., _d1941-, _eautor |
|
| 245 | 1 | 0 |
_aDefect and microstructure analysis by diffraction / _cRobert L. Snyder, Jaroslav Fiala, and Hans J. Bunge |
| 264 | 1 |
_aNew York : _bOxford University Press, _c1999 |
|
| 300 | _a785 páginas | ||
| 490 | 0 |
_aInternational union of crystallography monographs on crystallography _v10 |
|
| 504 | _aIncluye referencias bibliograficas e indice | ||
| 650 | 0 |
_aCristales _xDefectos _xAnalisis |
|
| 650 | 0 | _aDifracción | |
| 650 | 0 | _aCristalografía por rayos X | |
| 700 | 1 |
_aFiala, Jaroslav, _eautor |
|
| 700 | 1 |
_aBunge, H.-J., _eautor |
|
| 710 | 2 | _aUniversity of Oxford | |
| 336 |
_atexto _2rdacontent |
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| 337 |
_asin medio _2rdamedia |
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| 338 |
_avolumen _2rdacarrier |
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| 999 |
_c10918 _d10918 |
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