| 000 | 00860nam a2200265zi 4500 | ||
|---|---|---|---|
| 005 | 20230621110953.0 | ||
| 008 | 010228c 1999sw 000 0 eng d | ||
| 020 | _a3908450462 | ||
| 035 | _aMX001000873311 | ||
| 041 | _aSPA | ||
| 050 | 4 |
_aQC611.6D4 _bD46 |
|
| 084 | _aGeneral | ||
| 245 | 0 | 0 |
_aDefects and diffusion in semiconductors : _ban annual retrospective II / _ced. D. J. Fisher |
| 264 | 1 |
_aSwitzerland : _bScitec, _cc1999 |
|
| 300 | _a328 páginas | ||
| 490 | 0 |
_aDefect and diffusion forum, _xISSN 1012-0386 ; _vv. 171-172 |
|
| 650 | 4 |
_aSemiconductores _xDistribución de impurezas |
|
| 650 | 4 |
_aSemiconductores _xDefectos |
|
| 650 | 4 |
_aSemiconductores _xDifusión |
|
| 700 | 1 |
_aFisher, D. J., _eeditor |
|
| 336 |
_atexto _2rdacontent |
||
| 337 |
_asin medio _2rdamedia |
||
| 338 |
_avolumen _2rdacarrier |
||
| 999 |
_c11031 _d11031 |
||