| 000 | 00769nam a2200253zi 4500 | ||
|---|---|---|---|
| 005 | 20230621110954.0 | ||
| 008 | 010228c 1999si a 001 0 eng | ||
| 020 | _a9810223528 | ||
| 035 | _aMX001000873891 | ||
| 041 | _aENG | ||
| 050 | 4 |
_aTK7871 _bL38 |
|
| 084 | _aGeneral | ||
| 100 | 1 |
_aLau, W. S., _eautor |
|
| 245 | 1 | 0 |
_aInfrared characterization for microelectronics / _cW. S. Lauia |
| 264 | 1 |
_aSingapore : _bWorld Scientific, _cc1999 |
|
| 300 |
_a160 páginas : _bilustraciones |
||
| 650 | 0 |
_aMicroelectronica _xMateriales _xPruebas |
|
| 650 | 0 | _aEspectroscopia de infrarrojos | |
| 650 | 0 | _aEspectros de absorción | |
| 336 |
_atexto _2rdacontent |
||
| 337 |
_asin medio _2rdamedia |
||
| 338 |
_avolumen _2rdacarrier |
||
| 999 |
_c11060 _d11060 |
||