| 000 | 00902nam a2200265zi 4500 | ||
|---|---|---|---|
| 005 | 20230621111103.0 | ||
| 008 | 061002s2004 au a 000 0 eng d | ||
| 020 | _a3211206876 (empastado) | ||
| 035 | _aMX001001078209 | ||
| 040 |
_aOHX _bspa _cOHX _dZCU _dUKM _dDLC _dUNAMX |
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| 050 | 4 |
_aTK7871.15S55 _bP53 |
|
| 084 | _aGeneral | ||
| 100 | 1 |
_aPichler, Peter, _eautor |
|
| 245 | 1 | 0 |
_aIntrinsic point defects, impurities, and their diffusion in silicon / _cPeter Pichler |
| 264 | 1 |
_aWien : _bSpringer Verlag, _cc2004 |
|
| 300 |
_axxi, 554 páginas : _bilustraciones |
||
| 490 | 0 | _aComputational microelectronics | |
| 650 | 4 |
_aCristales de silicio _xDefectos |
|
| 650 | 4 |
_aSemiconductores _xDifusión |
|
| 830 | 0 |
_aComputational microelectronics _x0179-0307 |
|
| 336 |
_atexto _2rdacontent |
||
| 337 |
_asin medio _2rdamedia |
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| 338 |
_avolumen _2rdacarrier |
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| 999 |
_c13149 _d13149 |
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