000 | 00950nam a2200289zi 4500 | ||
---|---|---|---|
005 | 20230621111137.0 | ||
008 | 090909s2008 enk 000 0 eng | ||
020 | _a9780470027844 (encuadernado en tela) | ||
035 | _aMX001001187724 | ||
040 |
_aUNAMX _bspa _cUNAMX _dUNAMX |
||
050 | 0 | 0 |
_aTA417.23 _bB73 2008 |
082 | 0 | 0 |
_a620.1/1299 _222 |
084 | _aGeneral | ||
100 | 1 |
_aBrandon, D. G., _eautor |
|
245 | 1 | 0 |
_aMicrostructural characterization of materials / _cDavid Brandon and Wayne Kaplan |
250 | _a2nd ed. | ||
264 | 1 |
_aChichester, England : _bJ. Wiley, _cc2008 |
|
300 |
_axiv, 536 páginas : _bhojas (algunas a color) |
||
490 | 0 | _aQuantitative software engineering series | |
650 | 0 |
_aMateriales _xMicroscopĂa |
|
650 | 0 | _aMicroestructura | |
700 | 1 |
_aKaplan, Wayne D., _eautor |
|
336 |
_atexto _2rdacontent |
||
337 |
_asin medio _2rdamedia |
||
338 |
_avolumen _2rdacarrier |
||
999 |
_c14211 _d14211 |