000 00950nam a2200289zi 4500
005 20230621111137.0
008 090909s2008 enk 000 0 eng
020 _a9780470027844 (encuadernado en tela)
035 _aMX001001187724
040 _aUNAMX
_bspa
_cUNAMX
_dUNAMX
050 0 0 _aTA417.23
_bB73 2008
082 0 0 _a620.1/1299
_222
084 _aGeneral
100 1 _aBrandon, D. G.,
_eautor
245 1 0 _aMicrostructural characterization of materials /
_cDavid Brandon and Wayne Kaplan
250 _a2nd ed.
264 1 _aChichester, England :
_bJ. Wiley,
_cc2008
300 _axiv, 536 páginas :
_bhojas (algunas a color)
490 0 _aQuantitative software engineering series
650 0 _aMateriales
_xMicroscopĂ­a
650 0 _aMicroestructura
700 1 _aKaplan, Wayne D.,
_eautor
336 _atexto
_2rdacontent
337 _asin medio
_2rdamedia
338 _avolumen
_2rdacarrier
999 _c14211
_d14211