000 | 00881nam a2200253zi 4500 | ||
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005 | 20230621111329.0 | ||
008 | 230118s2022 xxua 001 0 eng d | ||
020 |
_a9780198862482 _qempastado |
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035 | _aMX001002180984 | ||
040 |
_aUNAMX _bspa _erda _cUNAMX _dUNAMX |
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050 | 4 |
_aQC482 _bW45 2022 |
|
084 | _aSerie | ||
100 | 1 |
_aWelberry, T. R. _q(Thomas Richard) _eautor |
|
245 | 1 | 0 |
_aDiffuse X-ray scattering and models of disorder / _cT.R. Welberry |
250 | _aSecond edition | ||
264 | 1 |
_aNew York, NY : _bOxford University Press, _c[2022] |
|
300 |
_axx, 400 páginas : _bilustraciones |
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490 | 0 |
_aInternational union of crystallography monographs on crystallography _v31 |
|
650 | 4 |
_aRayos X _xDispersión |
|
650 | 4 | _aCristalografía por rayos X | |
336 |
_atexto _2rdacontent |
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337 |
_asin medio _2rdamedia |
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999 |
_c17598 _d17598 |