| 000 | 00813nam a2200253zi 4500 | ||
|---|---|---|---|
| 005 | 20230621110606.0 | ||
| 008 | 970106s1990 a 000 0 eng | ||
| 020 | _a3527268847 | ||
| 035 | _aMX001000545725 | ||
| 050 |
_aTA417.23 _bF83 |
||
| 084 | _aGeneral | ||
| 100 | 0 |
_aFuchs, Ekkehard, _eautor |
|
| 245 | 1 | 0 |
_aParticle beam microanalysis : _bFundamentals, methods and applications / _cE. fuchs, h. oppolzer, h. rehme |
| 264 | 1 |
_aWeinheim : _bVch, _cc1990 |
|
| 300 | _a507 páginas | ||
| 650 |
_aMateriales _xMicroscopía |
||
| 650 |
_aMicroscopios electrónicos _xAplicaciones industriales |
||
| 700 |
_aOppolzer, Helmut, _eautor |
||
| 700 |
_aRehme, H. _eautor |
||
| 336 |
_atexto _2rdacontent |
||
| 337 |
_asin medio _2rdamedia |
||
| 338 |
_avolumen _2rdacarrier |
||
| 999 |
_c4195 _d4195 |
||