| 000 | 00737nam a2200241zi 4500 | ||
|---|---|---|---|
| 005 | 20230621110617.0 | ||
| 008 | 970106s1990 a 000 0 eng | ||
| 020 | _a0471511048 | ||
| 035 | _aMX001000566189 | ||
| 050 |
_aQC611 _bS39 |
||
| 084 | _aGeneral y Reserva | ||
| 100 | 0 |
_aSchroder, Dieter K., _eautor |
|
| 245 | 1 | 0 |
_aSemiconductor material and device characerization / _cDieter k. schroder |
| 264 | 1 |
_aNew York : _bJ. Wiley, _cc1990 |
|
| 300 | _axv, 565 páginas | ||
| 500 | _a"a wiley-interscience publication" | ||
| 650 | _aSemiconductores | ||
| 650 |
_aSemiconductores _xPruebas |
||
| 336 |
_atexto _2rdacontent |
||
| 337 |
_asin medio _2rdamedia |
||
| 338 |
_avolumen _2rdacarrier |
||
| 999 |
_c4525 _d4525 |
||