| 000 | 00865nam a2200277zi 4500 | ||
|---|---|---|---|
| 005 | 20230621110710.0 | ||
| 008 | 970106s1992 a 000 0 eng | ||
| 020 | _a0198564325 | ||
| 035 | _aMX001000671606 | ||
| 050 |
_aTK7871.85 _bR48 |
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| 084 | _aGeneral | ||
| 100 | 0 |
_aRichards, B. P., _eautor |
|
| 245 | 1 | 4 |
_aThe role of microscopy in semiconductor failure analysis / _cB. p. richards and p. k. footner |
| 264 | 1 |
_aOxford : _bOxford University Press, _c1992 |
|
| 300 | _avi, 108 páginas | ||
| 490 | 0 |
_aMicroscopy handbooks _v25 |
|
| 650 |
_aSemiconductores _xPruebas |
||
| 650 |
_aSemiconductores _xFallas |
||
| 650 | _aMicroscopios | ||
| 700 |
_aFootner, P. K., _eautor |
||
| 710 | 2 | _aUniversity of Oxford | |
| 336 |
_atexto _2rdacontent |
||
| 337 |
_asin medio _2rdamedia |
||
| 338 |
_avolumen _2rdacarrier |
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| 999 |
_c6241 _d6241 |
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